SYNOPSIS

int scan_read_oob(struct mtd_info * mtd, uint8_t * buf, loff_t offs, size_t len);

ARGUMENTS

mtd

MTD device structure

buf

temporary buffer

offs

offset at which to scan

len

length of data region to read

DESCRIPTION

Scan read data from data+OOB. May traverse multiple pages, interleaving page,OOB,page,OOB,... in buf. Completes transfer and returns the “strongest” ECC condition (error or bitflip). May quit on the first (non-ECC) error.

AUTHOR

Thomas Gleixner <[email protected]>

Author.

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